Rigaku Corporation has announced the release of the SmartLab® 3 system, a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance.
The SmartLab 3 system, which is debuting at the 14th European Powder Diffraction Conference (EPDIC), 15-18 June, in Aarhus, Denmark, offers continued refinement of the ease-of-use features that enabled the original SmartLab to receive the coveted R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and a five axis goniometer.
Award-winning guidance software recognizes installed components and seamlessly integrates them into data collection and data analysis methods. The cross beam optics module offers permanently mounted, permanently aligned and user selectable optical geometries for various diffraction experiments.
As an example, one can choose a Bragg-Brentano and parallel beam combination for measurements of both powders and thin films without the need for instrument reconfiguration.
One could also choose a Bragg-Brentano and focusing transmission combination to measure organic materials in both transmission and reflection modes.
The fifth, or in-plane, axis of the SmartLab 3 diffractometer allows the measurement of structures that are in the surface plane of the sample. This enables the measurement of extremely thin films and depth profiling in coatings. The SmartLab 3 system further extends application capability with the next-generation HyPix™-400 2-D detector.
This hybrid pixel array detector offers the highest resolution and count rates available today. It is manufactured and fully integrated into the SmartLab 3 system by Rigaku and, as such, offers the superior ease of use pioneered by Rigaku in the original SmartLab diffractometer.
The SmartLab 3 system configured with a HyPix-400 detector operates in 0-, 1-, and 2-D modes without the need to exchange the detector.