CRAIC Technologies has introduced the 20/30 XL™ UV-visible-NIR microspectrophotometer. The 20/30 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large samples when integrated into large scale sample handling machinery.
With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, Raman, luminescence and fluorescence with unparalleled speed and accuracy.
The system can also be configured to image microscopic sample areas in the UV and NIR regions in addition to high resolution color imaging.
Due to its flexible design which gives it the ability to analyze the largest samples, applications are numerous and include mapping color and intensity variations of flat panel displays, film thickness measurements across the entire surface of 300 mm wafers, scanning the surfaces of hard disks for defects to the analysis of entire paintings with high spatial resolution.
With the ability to spectral analyze and image microscopic samples, very large devices and everything in between, the 20/30 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.
“CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/30 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to analyze microscopic features of very large samples” states Dr. Paul Martin, President of CRAIC Technologies.
Dr. Martin continued, “As such, we have listened to our customers and created the 20/30 XL™, a system backed by years of experience in designing, building and the using of this type of instrumentation for spectroscopic and image analysis. It is a tool that can be used both in the research laboratory or on the production floor.”
The 20/30 XL™ microspectrophotometer integrates advanced spectrophotometers with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to attach to large frames that can accomodate large scale samples.
It is then able to acquire data from microscopic features of very large samples by absorbance, reflectance, Raman, fluorescence and other types of emission spectroscopy.
By including high-resolution digital imaging, the user is also able to use the instrument as a ultraviolet or infrared microscope.
Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis.
With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and the support of CRAIC Technologies, the 20/30 XL™ is more than just a quality control measurement tool…it is the solution to users analytical challenges.