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Rigaku Introduces Newest Instruments at Pittcon 2014

Published: Wednesday, February 26, 2014
Last Updated: Tuesday, February 25, 2014
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Company exhibits its benchtop lines of XRD and XRF instrumentation at Booth #2355.

Rigaku has announced its attendance at the 65th annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon 2014) held March 2 - 6, 2014 at McCormick Place, Chicago, IL, USA.

Rigaku is exhibiting its benchtop lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation, together with a line of handheld and portable Raman spectrometers, at Booth #2355.

Rigaku Americas Corporation (The Woodlands, TX) is showing the Rigaku Supermini200 benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the fifth generation Rigaku MiniFlex benchtop X-ray diffractometer, and the new Rigaku Micro-Z ULS WDXRF sulfur analyzer.

These powerful, transportable instruments deliver speed and sensitivity through innovative technology and design. The 600W MiniFlex is the most powerful system of its type and features an available sample changer. The Supermini200 is the only commercially available benchtop WDXRF spectrometer.

The Micro-Z sulfur analyzer is designed for ultra-low level sulfur analysis of diesel and petrol (gasoline) fuels. This benchtop WDXRF instrument, making its Pittcon debut, features a novel design that measures both the sulfur peak and the background intensity.

Applied Rigaku Technologies (ART) (Austin, TX) is displaying the new low-cost benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer, the Rigaku NEX QC+ and the Rigaku NEX CG Cartesian-geometry EDXRF spectrometer.

The NEX QC+ is a compact elemental analyzer that delivers rapid quantitative determination of sodium (11Na) to uranium (92U) in solids, liquids, powders and alloys. Specifically designed for routine quality control applications, the new NEX QC+ features an intuitive “icon-driven” touch screen interface and built-in printer for easy operation and convenience.

The 50kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver outstanding repeatability and long-term reproducibility with excellent element peak resolution. The NEX CG spectrometer is a powerful EDXRF analyzer designed to deliver rapid qualitative and quantitative determination of major and minor atomic elements across a wide variety of sample types.

The ART division is also displaying the new and advanced EDXRF process analyzer, the Rigaku NEX OL, for on-line, multi-element analysis of aluminum (13Al) to uranium (92U) in process liquids or for coating thickness and elemental composition in web and coil applications.

Rigaku Raman Technologies (Tucson, AZ) will unveil its new generation in handheld Raman analysis. Redesigned from the ground up, the portable device delivers improved performance, ease of use, and confidence to ensure the industry’s most accurate and comprehensive range of material identification available in a handheld form.

A demonstration of the new instrument will be presented at a press conference on Tuesday, March 4, at 1:30 PM in Meeting Room S-105D.


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