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  News Archive

Pittcon Announces Sanford Asher as Recipient of the 2016 SACP Award
Wednesday, September 30, 2015
Asher will accept this prestigious award at Pittcon 2016 in Atlanta, Georgia.

Benchtop NMR for Research and Teaching
Wednesday, September 30, 2015
Magritek reports on how the Chemistry Department at Durham University is applying the Spinsolve benchtop NMR for research and teaching.

Metamaterial Absorbers for Infrared Inspection Technologies
Tuesday, September 29, 2015
A metamaterial absorber capable of highly sensitive infrared detection enhances the spectroscopy of tiny molecular details.

Bruker’s NMR FoodScreener™ Laboratory Achieves ISO/IEC 17025 Accreditation
Monday, September 28, 2015
Bruker announced that its NMR FoodScreener™ laboratory for food authenticity and quality determination, located in Rheinstetten, Germany, has been granted ISO/IEC 17025 accreditation.

Thermo Fisher Scientific Announces Winners of 2016 Winter Conference Awards in Plasma Spectrochemistry
Wednesday, September 23, 2015
Independent committee recognizes significant contributions in plasma spectrochemistry.

Pancreatic Cancer Stem Cells Could be "Suffocated" by Anti-diabetic Drug
Tuesday, September 15, 2015
A new study shows that pancreatic cancer stem cells (PancSCs) are virtually addicted to oxygen-based metabolism, and could be “suffocated” with a drug already used to treat diabetes.

Marzipan Made From Pure Almonds
Friday, September 11, 2015
Researchers carry out DNA analyses and use advanced protein identification techniques to determine whether marzipan is made from pure almonds or also contains other nuts or beans.

Evidence of Ancient Life Discovered Deep Below the Seafloor
Tuesday, September 08, 2015
Ancient rocks harbored microbial life deep below the seafloor, reports a team of scientists from the Woods Hole Oceanographic Institution (WHOI), Virginia Tech, and the University of Bremen.

Kwansei Gakuin University in Hyogo, Japan, Uses Raman Microscopy
Wednesday, August 26, 2015
Raman Microscopy study crystallographic defects in silicon carbide wafers.

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