Bruker has announced the launch of the new, scalable ContourGT-K 3D optical microscope for value-oriented, uncompromised bench-top metrology.
Incorporating many of the advanced features of Bruker’s flagship optical metrology products, the ContourGT-K delivers unsurpassed Zaxis resolution across all fields of view and superior 2D/3D imaging capability for non contact profile, roughness and thickness measurements on a wide range of surfaces.
The system’s gage-capable, streamlined design includes integrated air isolation for robust vibration tolerance in even challenging production environments.
The new ContourGT-K also incorporates the latest version Bruker Vision64™ software and the most extensive library of pre programmed filters and analyses for easy access to advanced measurements for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications.
“Bruker has drawn on three decades of optical measurement experience and innovation to deliver a true metrology system at price points previously only attainable with traditional confocal imaging systems,” said Rob Loiterman, Executive Vice President and General Manager of Bruker’s Stylus and Optical Metrology Business.
Loiterman continued, “With ContourGT-K, researchers and engineers no longer have to choose between great images and quantifiable metrology.”
“Cost-optimized for high speed, accuracy, and ease of use, the ContourGT-K delivers the precision required for demanding metrology over a very broad range of surfaces,” added Kent Heath, Senior Director of Bruker’s Stylus and Optical Metrology Business.
Heath continued, “It features an extensive array of factory and field upgradeable add-ons, such as application-specific productivity software, automated turret, stages and tilt functions, color and high resolution camera options, and our unique NanoLens™ AFM module, which together make the ContourGT-K highly scalable to meet evolving customer needs.”