Bruker has announced at the 2012 Materials Research Society (MRS) Fall Meeting that its exclusive PeakForce Tapping™ technology has recently surpassed the 100 peer-reviewed publication mark.
This rate of adoption is even greater than Bruker’s TappingMode™, which since its launch in the early 1990s, has been considered the primary imaging mode of scanning probe microscopy.
PeakForce Tapping is the enabling technology behind Bruker’s suite of proprietary imaging modes that are bringing unprecedented atomic resolution imaging and ease of use to quantitative nanomechanical and nanoelectrical AFM characterization in biological and material science applications.
“By applying a precisely controlled, extremely low force response curve at every pixel, PeakForce Tapping protects both fragile probes and samples with no decrease in image resolution,” said Mark R. Munch, Ph.D., President, Bruker MAT Group and Bruker Nano Surfaces Division.
Munch continued, “This benefits our customers in many ways, from being able to use AFM with a broader range of samples and achieve true atomic resolution to our patented ScanAsyst®, which automatically and continuously monitors image quality and makes the appropriate parameter adjustments.”
“More and more PeakForce Tapping technology is becoming a core building block for advanced mechanical, electrical, and chemical nano-characterization,” added David V. Rossi, Executive Vice President and General Manager of Bruker's AFM Business.
Rossi continued, “We are further functionalizing this technology through packages such as PeakForce QNM®, which leverages the force response data of PeakForce Tapping to obtain quantitative nanomechanical information over a wide range. Other recent enhancements based on this technology include advanced conductivity mapping with PeakForce TUNA™ and surface potential mapping with PeakForce KPFM™. Only Bruker AFMs give users full access to these powerful new capabilities.”