Rigaku Introduces New NEX DE Analyzer
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Applied Rigaku Technologies, Inc. has announced its launch of the new Rigaku NEX DE direct excitation energy dispersive X-ray fluorescence (EDXRF) elemental analyzer. Especially engineered for heavy industrial use, whether on the plant floor or in remote field environments, the NEX DE analyzer was developed to maximize flexibility and ease of use.
The instrument was designed for demanding applications or for situations where analysis time or sample throughput is critical, and is suitable for a broad range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications.
The new NEX DE analyzer is equipped with a 60 kV, 12 W X-ray tube to deliver significant improvements in elemental peak resolution and counting statistics, resulting in superior calibrations and precision for the most challenging measurements. The high voltage, along with multiple automated X-ray tube filters, provides multi-element analysis capability for unmatched performance with low limits of detection (LOD). With direct excitation, energy requirements are significantly reduced, however. Because the sample-to-detector distance is less than one centimeter, less energy is required when compared to using secondary targets.
Next generation silicon drift detector (SDD) technology provides extremely high count rate capability with excellent spectral resolution. This enables the NEX DE to deliver the highest precision analytical results in the shortest possible measurement times.
Peltier cooled semiconductor detector technology is incorporated to deliver exceptional short-term repeatability and long-term reproducibility with excellent elemental peak resolution.
The system operates on the latest Rigaku QuantEZ analytical software, specifically designed for the Rigaku family of benchtop EDXRF analyzers. Running under the Microsoft Windows operating system, on a laptop or benchtop personal computer (PC), the software offers all the functions required for calibration and routine operation. Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ™ software walks the user through steps required to set up either an empirical or fundamental parameters application.
The optics are protected by a safety film that can be changed without tools. The system’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, as well as a variety of single position and autosampler options. Removable autosampler trays are interchangeable and support 32 mm and 40 mm cups.
The NEX DE spectrometer is positioned to be the ideal solution for elemental analysis in basic quality control (QC) or its more sophisticated variants, such as analytical quality control (AQC), quality assurance (QA) or statistical process control. The NEX DE spectrometer will debut at ACHEMA 2015, the world’s largest Process Industry convention, June 15-19, 2015 in Frankfurt, Germany.
