Application Note May 21, 2020
This datasheet investigates the capabilities of the Epsilon Xflow, an on‑line energy dispersive X-ray fluorescence spectrometer, as a tool to monitor real-time the extraction of uranium during in-situ leaching.
This application note explores the preparation of ferrosilicon alloy samples for analysis by X-ray fluorescence spectroscopy.
READ MOREThe study in this application note aims to demonstrate the capabilities of a Zetium, combined with the Stratos module for determining the mass thickness of nickel coatings on steels.
READ MOREThis application note determines if NIR is a useful tool to determine various properties of bread and cake flour.
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