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Advancing Atomic Force Microscopy by Reducing Noise

News   Jun 29, 2020 | Original story from the Beckman Institute for Advanced Science and Technology

 
Advancing Atomic Force Microscopy by Reducing Noise

Chemical signal produced by a 4 nm thick polymer film collected using previous deflection AFM-IR detection, top, compared to the new null-deflection approach. Credit: Beckman Institute for Advanced Science and Technology

 
 
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