EAG Completes Acquisition of the Accelerator Technology Business of Thin Film Analysis
News May 29, 2006
EAG will move the acquired assets of TFA into its Kifer Road facility in Sunnyvale, CA, thus adding a General Ionex Corporation Ion Accelerator to its current National Electrostatics Corporation Pelletron Accelerator.
"RBS provides quantitative composition, thickness, and non-destructive depth profiling of films with thicknesses ranging from 5nm to 1um," said Dr. Charles Magee, Chief Scientist of EAG.
"By combining RBS with HFS, NRA, and particle induced X-ray emission (PIXE) analysis performed using the same particle accelerator all elements can typically be quantified with a high degree of accuracy without the need for reference standards."
"This makes RBS an ideal complement to Secondary Ion Mass Spectrometry (SIMS), Auger Electron Spectrometry (AES), and X-ray Photoelectron Spectrometry (XPS) analytical services also offered by EAG."
"This increased instrument capacity advances EAG's position as the industry leader in accelerator-related analytical services."
TFA's principal, Michael Strathman, said, "I am extremely pleased with this transaction."
"I spent 10 years with Charles Evans & Associates (Now EAG) prior to forming TFA and return quite impressed with the customer service focus, technical advances, depth of resources and overall growth achieved by EAG."
"Michael's knowledge and expertise in accelerator technology, the TFA accelerator and the Detector software will be great additions to the EAG team," said EAG CEO Tom Pfeil.
"We share Michael's enthusiasm for this deal. Accelerator analytical services continue to grow in importance for our high technology customers and we are committed to meeting their current and future needs."