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Inventor of AFM-IR Technique to Receive Ernst Abbe Memorial Award
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Inventor of AFM-IR Technique to Receive Ernst Abbe Memorial Award

Inventor of AFM-IR Technique to Receive Ernst Abbe Memorial Award
News

Inventor of AFM-IR Technique to Receive Ernst Abbe Memorial Award

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Anasys Instruments has announced that the inventor of the AFM-IR technique, Professor Alexandre Dazzi from the Université Paris-Sud, is to receive the Ernst Abbe Memorial Award.

The award is given by the New York Microscopy Society and will be presented at the 2014 Eastern Analytical Symposium and Exhibition being held November 17-19, Somerset, New Jersey, USA.

Professor Alexandre Dazzi, from the Laboratoire de Chimie Physique at the Université Paris-Sud has been selected to receive the New York Microscopy Society’s Ernst Abbe Award.

Since its inception in 1973, 24 scientists have been recognized including innovators such as Albert V. Crewe (inventor of Scanning Electron Transmission Microscopy), Edwin H. Land (inventor of Polaroid photography), Gerd Binning & Heinrich Rohrer (inventors of AFM). The Society presents this award to acknowledge the recipient’s outstanding contributions to imaging science and microscopy.

The Abbe Award will be presented to Professor Dazzi at a special Abbe Award Symposium within the 17-19 November 2014 Eastern Analytical Symposium and Exhibition (EAS).

As the Abbe awardee, Professor Dazzi will present a paper on his work within the Abbe Award Symposium chaired by John A. Reffner, Professor of Forensic Science at John Jay College, CUNY.

Professor Dazzi’s work has been commercialized by Anasys Instruments in Santa Barbara, California with a product called nanoIR™. Now, in its second generation, the nanoIR2™ is a nanoscale material property measurement platform that combines atomic force microscopy (AFM) with IR spectroscopy, thermal and mechanical analysis.

Dr, Craig Prater, CTO of Anasys, added that "We are delighted that Alex's groundbreaking innovation is being recognized by this prestigious honor. We frequently hear from customers and collaborators that AFM-IR allows them to perform measurements they can't achieve with any other technique."

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