A New Perspective of Plasma Observation in ICP-OES – PlasmaQuant® PQ 9000
Product News Jul 01, 2016
PlasmaQuant® PQ 9000 – A New Perspective of Plasma Observation in ICP-OES A novelty in High-Resolution (HR) atomic spectrometry, the Dual View PLUS plasma observation of Analytik Jena’s PlasmaQuant® PQ 9000 is now bringing productivity and operator convenience to the most elaborate HR ICP-OES routines.
Probing an analytically superior vertical plasma by end-on and side-on observation with complementary attenuation of both the axial and the radial view, respectively, Dual View PLUS reaches well-beyond traditional boundaries of ICP-OES and thus takes ultra-trace detection capabilities, linear dynamic working ranges as well as the overall signal stabilities a major step ahead.
Its fast adaptation of plasma views to the required sensitivities and working ranges ensures supreme operator flexibility at compatible speed and sample costs. Dual View PLUS means free selection of 2+2 plasma views in every routine and stands for instrumental flexibility instead of lengthy sample preparation. Look forward to the most sensitive axial plasma views on the market: That of PlasmaQuant® PQ 9000 series.