Agilent Technologies Introduces Surface Imaging and Analysis Software to Extend Atomic Force Microscope Utility
Product News Jan 22, 2008
Agilent Technologies, Inc. has introduced Pico Image, an atomic force microscope (AFM) imaging and analysis software package designed for AFM users working in a wide range of research applications, including life sciences and material sciences. Pico Image analyzes image data and generates dynamic, highly detailed surface analysis reports with power and ease.
“Pico Image has now been integrated into the PicoView software platform for our complete line of AFMs, including the 5400 and 5500,” said Jeff Jones, operations manager for Agilent’s AFM facility in Chandler, Arizona. “Pico Image allows our customers to easily visualize and analyze the structures and properties of their samples.”
Each Pico Image analysis document consists of a set of frames containing: surfaces, profiles extracted from surfaces, the results of applying filters and other operators, analytical studies, and 2D and 3D parameters that conform to international standards.
Videos of flight paths over a surface can also be integrated into Pico Image presentations. The software’s desktop publishing interface, comprehensive online help, and multilanguage support enhance ease of use.
Pico Image contains three performance levels, offering feature sets that meet the needs of basic, advanced, and expert users, respectively. Sophisticated functions include the ability to convert a surface into a series of profiles, compute the similarity of different surfaces, generate sub-surfaces, and perform fractal analysis. Particle analysis and statistics options are also offered. Standalone and network licenses are available.