ART Presents Latest EDXRF Solutions at PEFTEC 2015
Complete the form below to unlock access to ALL audio articles.
Applied Rigaku Technologies, Inc. (ART) will be presenting its line of energy dispersive X-ray fluorescence (EDXRF) instrumentation at the PEFTEC conference and exhibition (PEFTEC 2015) on November 18 -19, 2015 in Antwerp, Belgium, at the Antwerp Expo.
The event is a focused international conference and exhibition for analytical chemists, scientists, process operators, laboratory personnel and Environmental Managers who work in around the petroleum, refining, chemical and petrochemical industries.
EDXRF is employed for rapid non-destructive elemental analysis of crude, oils, gasoline, fuels, lubricants and waste materials. ART will be exhibiting its lines of EDXRF instrumentation at Booth # 50.
Among the benchtop elemental analysis products on display will be the new Rigaku NEX DE premium high-performance direct excitation EDXRF elemental analyzer and the Rigaku NEX QC+ high-resolution EDXRF spectrometer.
The new NEX DE™ analyzer was developed for heavy industrial applications and engineered to maximize flexibility and ease of use. It is equipped with a 60 kV, 12 W X-ray tube and advanced Peltier cooled silicon drift detector (SDD) for significant gains in elemental peak resolution and counting statistics, to deliver superior calibrations and precision for the most challenging measurements.
The system operates on the latest Rigaku QuantEZ analytical software, specifically designed for the Rigaku family of benchtop EDXRF analyzers. Running under the Microsoft Windows operating system, on a laptop or benchtop personal computer (PC), the software offers all the functions required for calibration and routine operation.
The NEX QC+ spectrometer is a compact elemental analyzer that delivers rapid quantitative determination of sodium (11Na) to uranium (92U) in solids, liquids, powders and alloys. Specifically designed for routine quality control applications, the NEX QC+ features an intuitive “icon-driven” touch screen interface and built-in printer for easy operation and convenience. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver outstanding repeatability and long-term reproducibility with excellent element peak resolution.
In addition to its line of benchtop EDXRF analyzers, the ART division will be presenting the Rigaku NEX OL EDXRF process analyzer, for on-line, multi-element analysis of process liquids including Sulfur in Fuels.
The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) X-ray optics are also effective for coating thickness and elemental composition in web and coil applications. Featuring advanced third generation EDXRF technology, the advanced NEX OL analyzer represents the next evolution of elemental analysis for liquid stream and fixed position web or coil applications.
