Asylum Research Introduces Ztherm™ Modulated Thermal Analysis with Sub-Zeptoliter Resolution
Product News Jun 26, 2009
Asylum Research has announced the new Ztherm Modulated Local Thermal Analysis Option for its MFP-3D™ and Cypher™ AFMs. Ztherm is designed to provide localized heating with sensitivity to =10-22 liter (sub-zeptoliter) materials property changes.
A standing problem with existing AFM-based thermal analysis systems is thermally induced bending of the cantilever that results in spurious deflection signals and variable loads being applied during heating.
Asylum has developed a patent-pending cantilever compensation and control solution that corrects this problem, providing constant-load detection of thermally induced melting (Tm), phase transitions (Tg) and other morphological and compliance effects for materials studies and material identification – for areas less than 20nm x 20nm.
In addition to standard thermal analysis capabilities, the Ztherm package can also be used to evaluate contact stiffness and dissipation as a function of temperature with advanced techniques such Dual AC Resonance Tracking (DART).
The contact stiffness and dissipation are sensitive to temperature dependent properties, including surface melting and transition temperatures. In addition, integrated piezo actuation allows high resolution AC imaging of samples for surface topographical mapping before and after thermal measurements. The Ztherm option is compatible with and includes Anasys Thermalever™ probes.