We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience. You can read our Cookie Policy here.

Advertisement
Asylum Research Introduces Ztherm™ Modulated Thermal Analysis with Sub-Zeptoliter Resolution
Product News

Asylum Research Introduces Ztherm™ Modulated Thermal Analysis with Sub-Zeptoliter Resolution

Asylum Research Introduces Ztherm™ Modulated Thermal Analysis with Sub-Zeptoliter Resolution
Product News

Asylum Research Introduces Ztherm™ Modulated Thermal Analysis with Sub-Zeptoliter Resolution


Want a FREE PDF version of This Product News?

Complete the form below and we will email you a PDF version of "Asylum Research Introduces Ztherm™ Modulated Thermal Analysis with Sub-Zeptoliter Resolution"

First Name*
Last Name*
Email Address*
Country*
Company Type*
Job Function*
Would you like to receive further email communication from Technology Networks?

Technology Networks Ltd. needs the contact information you provide to us to contact you about our products and services. You may unsubscribe from these communications at any time. For information on how to unsubscribe, as well as our privacy practices and commitment to protecting your privacy, check out our Privacy Policy

Asylum Research has announced the new Ztherm Modulated Local Thermal Analysis Option for its MFP-3D™ and Cypher™ AFMs. Ztherm is designed to provide localized heating with sensitivity to =10-22 liter (sub-zeptoliter) materials property changes.

A standing problem with existing AFM-based thermal analysis systems is thermally induced bending of the cantilever that results in spurious deflection signals and variable loads being applied during heating.

Asylum has developed a patent-pending cantilever compensation and control solution that corrects this problem, providing constant-load detection of thermally induced melting (Tm), phase transitions (Tg) and other morphological and compliance effects for materials studies and material identification – for areas less than 20nm x 20nm.

In addition to standard thermal analysis capabilities, the Ztherm package can also be used to evaluate contact stiffness and dissipation as a function of temperature with advanced techniques such Dual AC Resonance Tracking (DART).

The contact stiffness and dissipation are sensitive to temperature dependent properties, including surface melting and transition temperatures. In addition, integrated piezo actuation allows high resolution AC imaging of samples for surface topographical mapping before and after thermal measurements. The Ztherm option is compatible with and includes Anasys Thermalever™ probes.
Advertisement