Bruker Introduces MultiMode 8-HR AFM for Nanoscale Research
Product News Jan 16, 2016
Bruker’s Nano Surfaces Division has announced the release of the MultiMode 8-HR Atomic Force Microscope (AFM), which brings extensive new capabilities for nanomechanics and higher speed imaging to the world’s highest resolution, most widely-used and field-proven scanning probe microscope (SPM).
The new nanomechanics features of MultiMode 8-HR enable researchers to access the broadest range of ramp frequencies for viscoelastic studies and nanomechanical assessment of a wide range of materials, from soft biological specimens to hard metallic samples.
“The MultiMode® platform has long been the gold standard for performance and application versatility, and we’ve significantly enhanced its capabilities with the MultiMode 8-HR,” commented Stephen Minne, Ph.D., Vice President and General Manager of Bruker’s AFM Business. “Unique improvements include higher speeds, higher resolution imaging, new capabilities in nanomechanics with enhanced PeakForce QNM®, and new FastForce Volume™ modes. In keeping with our ongoing commitment to our thousands of loyal MultiMode customers, we have designed these new developments in resolution, flexibility, and reliability to be available also as upgrades to their current MultiMode systems.”