We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience, read our Cookie Policy

Advertisement

Bruker Introduces Opterra II Multipoint Scanning Confocal Microscope

Product News   Aug 12, 2015

 
Bruker Introduces Opterra II Multipoint Scanning Confocal Microscope
FURTHER INFORMATION
 
 
Advertisement
 

Related Product News

JEOL Introduces New Configuration of Broad Ion Beam Milling Cross Section Polisher

Product News

JEOL USA introduces a new configuration of its broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high-resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM).

READ MORE

JEOL Announces New Cold Field Emission Cryo-Electron Microscope

Product News

New cryo-EM has been developed based on the concept of “Quick and easy to operate and get high-contrast and high-resolution images”.

READ MORE

Molecular Devices Unveils Next-Generation Imaging System with Deep Learning Technology

Product News

Built on the success of the company’s flagship model, the ImageXpress® Confocal HT.ai High-Content Imaging System is designed to help researchers advance phenotypic screening of 3D organoid models.

READ MORE

To personalize the content you see on Technology Networks homepage, Log In or Subscribe for Free

LOGIN SUBSCRIBE FOR FREE