Bruker Launches the First Guaranteed AFM TERS Solution
Product News Sep 19, 2014
Bruker has announced the launch of the new-generation Innova-IRIS, the first guaranteed Tip-Enhanced Raman Spectroscopy (TERS) system specifically designed to accelerate the adoption and time-to-publish of nano-Raman spectroscopy research.
The new system combines Bruker-exclusive, high-contrast tuning-fork-based TERS probes with high-performance AFM and nano-Raman spectroscopy capabilities to provide a consistently high TERS signal enhancement and the highest spectral sensitivity for interrogating the most challenging samples.
With Innova-IRIS, non-destructive, label-free chemical detection at the nanoscale is now finally a reality for a wide range of research.
Innova-IRIS includes closed loop, ultra-low noise AFM system, with advanced Raman spectroscopy software integration, no-drift mechanical system stability, and wide-open optical access to the AFM head to provide the ultimate commercially available solution for challenging TERS applications.
“TERS is an important technique for new discoveries in materials science; however, the lack of commercially available TERS probes has been a major limitation in providing researchers with a complete solution for making TERS measurements,” explained Professor Andrea Tao of the Department of NanoEngineering at the University of California, San Diego. “I am excited about Bruker’s new integrated TERS solution, which enables me to focus on what is most important in my work-scientific discovery.”
“Bruker’s Innova-IRIS has been enhanced with our new TERS-AFM probes, which are manufactured in-house to the highest standards to guarantee high-performance TERS,” added David V. Rossi, Executive Vice President and General Manager of Bruker's AFM Business.
Rossi continued, “The nanoscale chemical information provided by the Innova-IRIS complete TERS solution joins Bruker’s other notable recent advances in this area, namely Inspire™ with PeakForce IR™, the first integrated AFM-based infrared system for 10-nanometer spatial resolution in chemical and materials property mapping.”