Colorimetry and Intensity Mapping of Large Displays With Microscopic Spatial Resolution - A Novel Solution from CRAIC Technologies
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CRAIC Technologies, has introduced the 20/20 XL™ UV-visible-NIR microspectrophotometer. The 20/20 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large displays by being capable of incorporating large scale sample handling.
With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to color imaging.
Due to its flexible design which gives it the ability to analyze the largest displays, applications are numerous and include mapping color and intensity variations, film thickness measurements, and even scanning the surfaces of display components for defects. With the ability to spectral analyze and image microscopic features of very large devices, the 20/20 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.
“CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/20 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to analyze microscopic features of very large displays” states Dr. Paul Martin, President of CRAIC Technologies. “As such, we have listened to our customers and created the 20/20 XL™, a system backed by years of experience in designing, building and the using of this type of instrumentation for spectroscopic and image analysis.”
The 20/20 XL™ microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to attach to large sample handling frames so that even the largest displays may be analyzed.
It is able to acquire data from microscopic features of very large samples by absorbance, reflectance or even luminescence spectroscopy, in addition to microcolorimetry, film thickness measurements and even imaging in the UV, visible and NIR regions.
Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis. With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and the support of CRAIC Technologies, the 20/20 XL™ is more than just a quality control measurement tool…it is the solution to your analytical challenges.