We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience. You can read our Cookie Policy here.

FEI Launches Helios G4 DualBeam Series for Materials Science
Product News

FEI Launches Helios G4 DualBeam Series for Materials Science

FEI Launches Helios G4 DualBeam Series for Materials Science
Product News

FEI Launches Helios G4 DualBeam Series for Materials Science

Want a FREE PDF version of This Product News?

Complete the form below and we will email you a PDF version of "FEI Launches Helios G4 DualBeam Series for Materials Science"

First Name*
Last Name*
Email Address*
Company Type*
Job Function*
Would you like to receive further email communication from Technology Networks?

Technology Networks Ltd. needs the contact information you provide to us to contact you about our products and services. You may unsubscribe from these communications at any time. For information on how to unsubscribe, as well as our privacy practices and commitment to protecting your privacy, check out our Privacy Policy

FEI has continued to lead the industry with the launch of the Helios™ G4 DualBeam Series for materials science, offering highly automated and precise sample preparation for transmission electron microscopy (TEM) and three-dimensional (3D) sample characterization. The Helios G4features FEI’smost advanced scanning electron microscope (SEM) and focused ion beam (FIB)technology with a new level of automation and ease-of-use.

“We are pleased to announce this flagship DualBeam family, which brings a higher level of performance to our materials science customers. The Helios G4 is equipped with new technology to help materials scientists obtain the highest quality subsurface and 3D information at the nanometer scale. The DualBeam’s new guidedTEM sample preparation workflow enables even novice users to quickly and easily prepare high-quality, ultra-thin samples for S/TEM imaging,” states Trisha Rice, vice president and general manager of FEI’s Materials Science Business.

The Helios G4 offers many innovative enhancements. Some of the most significant include:

• FEI’s latest and most precise Phoenix FIB column, with industry leading low-voltage performance for ultra-low sample damage,
• FEI’s high-resolution Elstar electron column, with the new UC+ technology that offers 4x moremonochromated current than the previous generation,
• Auto Slice & View 4.0 software for unattended FIB nanotomography and a semi-automated workflow for TEM sample preparation, both of which provide high quality results, faster and easier than ever before.

The Helios G4 DualBeam Series also includes the FX model -- a flexible system that delivers dramatic sub-three Ångström STEM resolution. The FX model combines high-resolution imaging and sample preparation on one system, so results can be obtained within minutes of completing the lamella without removing the sample from vacuum, rather than the hours or days required previously to finalize the images on a stand-alone S/TEM system.

“The unique combination of new column technology, software and control electronics helps to support advanced materials characterization,” adds Rice.“The Helios G4 provides essential data to multi-scale, multimodal workflows, giving scientists the ability to locate and obtain information quickly and easily. These novel product enhancements continue to differentiate FEI’s flagship DualBeam Series from all other FIB/SEM solutions on the market.”