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JEOL Mass Spectrometry News for Pittcon 2014
Product News

JEOL Mass Spectrometry News for Pittcon 2014

JEOL Mass Spectrometry News for Pittcon 2014
Product News

JEOL Mass Spectrometry News for Pittcon 2014


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JEOL USA, Inc. has received several purchase orders from industrial and academic laboratories, with systems already delivered and installed in the US and Canada. 

In collaboration with JEOL, GC Image LLC and Zoex have continued to enhance the GC Image software to extend the ability to interpret the high-resolution exact mass data that can be obtained with the JEOL AccuTOF GCV 4G time-of-flight mass spectrometer equipped with the Zoex thermal modulator.  AccuTOF GCV 4G data can be imported directly into GC Image for processing GC x GC data.  Exact masses and isotopic data provide elemental compositions and mass spectral database searching for the identification of both knowns and unknowns in highly complex mixtures. Exact-mass selected ion chromatograms provide selectivity for target compound identification.  

JEOL’s AccuTOF-DART business continues to be strong.  In response to the need for higher throughput, Shrader Software Solutions has continued to work with JEOL to add automated reporting capabilities for both quantitative and qualitative DART data measured with autosamplers such as the DART SVP transmission module and most recently, the IonSense Quick Strip cards.  

The JEOL SpiralTOF MALDI TOF/TOF system offers the highest resolving power of any commercial MALDI TOF system, and its unique capability for monoisotopic precursor selection in combination with high-energy collision-induced dissociation (CID) offers unparalleled tools for ion structure determination.  The resolving power specification of the SpiralTOF has now been increased to 75,000. In addition, JEOL is now able to offer MALDIVision software from Premier Biosoft that permits the processing of large datasets from MALDI imaging with high-resolution mass spectral data.   Imaging with the SpiralTOF offers complementary information to that obtained with JEOL’s electron optic product line,  offering unique possibilities for correlative microscopy. 

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