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Olympus Exhibits Microscopy and Inspection Solutions at World’s First Virtual Analytical Summit
Product News

Olympus Exhibits Microscopy and Inspection Solutions at World’s First Virtual Analytical Summit

Olympus Exhibits Microscopy and Inspection Solutions at World’s First Virtual Analytical Summit
Product News

Olympus Exhibits Microscopy and Inspection Solutions at World’s First Virtual Analytical Summit


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Olympus will exhibit its microscopy and industrial inspection solutions to a global online audience at the new SelectScience Virtual Analytical Summit 2020, taking place from 31 March to 2 April 2020. The event is free to register and attend and will connect 900k+ scientists with presentations, workshops, video interviews, virtual booths, cutting-edge resources, the latest product and application news, Q&As, networking and live-chat opportunities.

As the spread of COVID-19 forces the postponement of key events in the scientific calendar, the Virtual Summit offers a crucial forum for scientists and leading manufacturers to continue to connect in order to advance science. The virtual summit will enable scientists and scientific manufacturers to come together from across the world to explore headline topics across many areas, including life science, pharma and materials science.

Responding to this need, Olympus will exhibit a wide range of solutions for applications ranging from routine cell culture through to high-content screening and elemental analysis for alloy identification, including:

  • High-performance X Line objectives for exceptional image quality for researchers and clinicians alike
  • The compact, ergonomic CKX53 inverted cell culture microscope for routine wet lab use
  • The flexible, wireless EP50 color camera – perfect for use in classroom teaching
  • DSX1000 digital microscopes, which offer speed and versatility to materials inspection thanks to easy switching between six observation modes and a rotating head and stage
  • Vanta handheld XRF analyzers, which deliver rapid and accurate elemental analysis and alloy identification in the field
  • The SLIDEVIEW VS200 digital slide scanner for easy analysis, sharing and archiving of slides
  • The scanR high-content screening station featuring deep learning technology


Deep learning in microscopy has seen a rapid increase over the past years. To demonstrate the capabilities of the latest AI-based systems, Dr. Daniel Krüger of Olympus Soft Imaging Solutions will give a presentation at 2pm BST / 3pm CEST on 1 April, which will cover:

  • A practical introduction to deep learning and neural networks
  • Analysis examples of self-learning microscopy
  • Applications of deep learning in microscopy and high-content screening


The summit opens from 31 March to 2 April 2020 (11am–8pm BST / 12–9pm CEST) and delegates will be able to drop in and out as convenient.


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