PANalytical Brings Advanced XRF Standardless Analysis to the Benchtop with Omnian and MiniPal 4
Product News May 25, 2010
PANalytical has extended the compatibility of its Omnian advanced standardless analysis software to now include the compact benchtop MiniPal 4 X-ray fluorescence (XRF) spectrometer.
This combination offers a premium XRF solution that is both easy to use. It is ideal for routine lab and field analysis, offering quantification of unknowns in situations where certified standards are not available.
Ready for any sample type, Omnian provides elemental analysis of all materials no matter how they have been prepared. Typical applications include screening, comparative analysis and R&D investigations.
In the default ‘black box’ mode, Omnian can provide answers for industries such as: healthcare, pharmaceutical, food, environmental, oil, minerals and mining. Unlike traditional standardless approaches, Omnian data is both comprehensive and available for detailed review.
Incorporating cutting-edge technology, Omnian is designed to achieve accuracy, setting the benchmark for standardless analysis. This is achieved through the automatic use of PANalytical’s advanced Fundamental Parameters (FP) algorithm which deals with the analytical challenges posed by differing sample types. Other innovations include the support of multiple excitation conditions and the inclusion of several features.