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Rigaku Introduces New XRD, Raman and EDXRF Instruments at Pittcon 2012
Product News

Rigaku Introduces New XRD, Raman and EDXRF Instruments at Pittcon 2012

Rigaku Introduces New XRD, Raman and EDXRF Instruments at Pittcon 2012
Product News

Rigaku Introduces New XRD, Raman and EDXRF Instruments at Pittcon 2012


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Rigaku has announced its attendance at the 62nd annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (Pittcon 2012) from March11 through March 15, 2012 at the Orange County Convention Center in Orlando, Florida.

Rigaku will be exhibiting its benchtop lines of X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) instrumentation at Booth #967. Rigaku’s new line of handheld and portable Raman spectrometers will be displayed separately at Booth #734.

Ideally suited for fast-paced XRD analyses, the new 5th generation Rigaku MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600 W X-ray source.

The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios.

If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer.

Whether used for teaching X-ray diffraction at the college and university level or routine industrial quality assurance, the MiniFlex delivers both performance and value.

The new Rigaku NEX QC VS elemental analyzer features a single-position sample stage with three analysis spot size options - 3 mm, 8 mm and 14 mm - that are easily changeable.

Large irregular objects, as well as small items, are accommodated by the large 190 x 165 x 60 mm sample chamber.

A 1.3 megapixel CMOS camera and LED lighting system allows a sample to be visualized on the smart-phone-like touch screen interface. For complete clarity and optimal sample alignment, the region to be analyzed is marked on the real-time image by a reticle.

An optional fundamental parameters (FP) software module is available to reduce the number of standards required for calibration.

Rigaku announced the release of world’s first dual wavelength handheld Raman analyzer.

Built on the stabilized platform of the Xantus-1, the new Rigaku Xantus-2 combines the technology of 785 nm and 1064 nm Raman spectrometers into one compact package.

Xantus-2 was designed specifically to overcome the intrinsic fluorescence issues found in many materials, with dual wavelengths providing an extensive range of materials analysis capabilities in a handheld form factor.

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