Rigaku Presents latest XRD instruments at 2016 European Crystallography Meeting
Product News Aug 30, 2016
Rigaku Corporation will present its diverse lines of X-ray diffraction (XRD) instrumentation, including the latest powder crystallography systems and stress analysers at the 30h European Crystallography Meeting (ECM-30). The conference is taking place August 28 through September 1, 2016 at the Congress Center in Basel, Switzerland. Rigaku Oxford Diffraction is debuting the newest edition of the Rigaku XtaLAB Synergy single crystal diffractometer.
The updated model contains a new PhotonJet R X-ray source based on a new rotating anode that runs at lower power and is air cooled, but does not compromise performance. Rigaku is also presenting its current powder X-ray diffraction systems. On display will be the Rigaku MiniFlex benchtop XRD system. The fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials.
The Rigaku SmartLab system, a multi-purpose diffractometer with SAXS and in-plane capabilities, is also being featured. The Rigaku HyPix-3000 next-generation two-dimensional semiconductor detector is available on the SmartLab® diffractometer, to enhance its capabilities and flexibility. The Rigaku SmartSite RS is the world’s smallest portable stress analyzer that is especially designed for on-site analysis.
It is capable of characterizing residual stress of metal parts ranging from large construction projects to individual products. The X-ray measuring head unit is controlled by a tablet PC via a wireless (Wi-Fi) connection, enabling remote operation of the device. ECM-30 includes workshops and seminars enabling scientists from across Europe and the world to meet, connect and exchange ideas. XRD systems and information from Rigaku will be available at Booth # C30 throughout the event.