Rigaku to Promote Latest X-ray Analytical Instrumentation at GSA 2015
Product News Oct 29, 2015
Rigaku Corporation will be presenting its diverse lines of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation at GSA 2015, the Geological Society of America conference.
Rigaku will be exhibiting at the conference at booth #437.
X-ray analysis techniques have been routinely employed in geological research. The latest generation of wavelength dispersive XRF instrumentation enables chemical composition mapping by use of small analyzing areas and an XY-stage enabling multiple measurements of a sample.
XRD is utilized to quantitatively measure phase composition. For quantitative crystalline phase determination, Rietveld analysis of X-ray diffraction data is among the most powerful methods available. Rigaku technology and expertise provide a number of unique solutions for these types of analysis.