Shimadzu’s New LC-MS/MS
Product News Jun 02, 2015
Shimadzu Scientific Instruments has announced the release of its LCMS-8060 triple quadrupole mass spectrometer. The newest model in the Ultra-Fast Mass Spectrometry (UFMS) series, the LCMS-8060 combines Shimadzu’s proprietary ultrafast technologies (UF Technologies) with new ion guide technology. This unparalleled combination results in outstanding data quality and higher throughput for a wide array of challenging and routine applications.
The LCMS-8060 features new technology, including a stronger vacuum system and a redesigned UF-Qarray ion optical system, for the highest levels of sensitivity in both MRM and scan modes. The instrument’s redesigned UF-Qarray features highly effective ion focusing capabilities.
This technology helps reduce electrode contamination that can lead to poor instrument performance. Because the instrument stays clean and free of contaminants, the LCMS-8060 can provide highly reliable data even for long, continuous analysis of potentially contaminated items like biological and food samples.
As part of the UFMS series, the LCMS-8060 incorporates a number of UF Technologies to enable the highest levels of analytical throughput. These technologies provide for a scan speed of 30,000 u/sec while maintaining mass accuracy and multiple reaction monitoring (MRM) speeds of 555 ch/sec. A polarity switching speed of 5 msec. ensures highly reproducible data and provides sufficient data points for the narrowest peaks. These features allow high-speed acquisition of both quantitative and qualitative data in a single run.
The instrument is designed for durability and easy operation and maintenance to reduce downtime. The ionization unit features a cable-free, tubeless housing for convenience when switching from ESI to APCI or dual ionization mode. In addition, the desolvation capillary can be replaced without breaking vacuum, allowing for greater uptime and usability.
The LCMS-8060 is operated using Shimadzu’s LabSolutions software, an intuitive package that allows for simplified instrument control, diverse data handling, and integration with regulatory compliance requirements.
In addition, it has been enhanced for better MRM optimization and synchronized survey scanning (SSS). An improvement to the MRM algorithm means that the LC processing overlaps during analysis, resulting in a 25 percent reduction in optimization time per analysis.