SPECTRO Analytical’s iQ II EDXRF Spectrometer
Product News Jun 10, 2013
The iQ II EDXRF Spectrometer from SPECTRO Analytical gives precise, accurate results for low sulphur content analysis of fuels.
EDXRF analysis is widely used in this application, but the evolving regulatory environment requires constant development and advances in detection sensitivity. This is achieved in the iQ II through the use of polarized excitation.
The instrument’s outstanding detection limit of ≤ 0.5 mg/kg sulphur and its compliance to EN ISO 13032 means it delivers reliable analysis of even sulphur-free fuels, placing it at the forefront of commercial benchtop EDXRF systems.
To achieve these exceptional levels of sensitivity the advanced polarized X-ray optical system within the iQ II Spectrometer uses a curved HOPG (highly oriented pyrolytic graphite) crystal. This is located close to the sample to ensure optimum excitation for light elements.
By combining this optical system with a 50 W X-ray tube and a powerful Peltier-cooled Silicon Drift Detector, performance approaching that of much more costly Wavelength Dispersive (WDXRF) instruments can be achieved, but without the long-term running costs.
In addition, the iQ II Spectrometer has excellent repeatability and reproducibility and meets all requirements of modern labs in terms of size, power and energy consumption.
A selection of pre-programmed applications software packages are available, including ultra-low sulphur in fuel, which comply with international regulations.
The iQ II has the added advantage of allowing users to carry out their analysis on transport vessels themselves, such as ships and other external environments, meaning there is no need to transport samples to a laboratory.