We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience. You can read our Cookie Policy here.

Advertisement
TrueSurface Microscopy Now Integrated with the WITec alpha300 Series
Product News

TrueSurface Microscopy Now Integrated with the WITec alpha300 Series

TrueSurface Microscopy Now Integrated with the WITec alpha300 Series
Product News

TrueSurface Microscopy Now Integrated with the WITec alpha300 Series


Want a FREE PDF version of This Product News?

Complete the form below and we will email you a PDF version of "TrueSurface Microscopy Now Integrated with the WITec alpha300 Series"

First Name*
Last Name*
Email Address*
Country*
Company Type*
Job Function*
Would you like to receive further email communication from Technology Networks?

Technology Networks Ltd. needs the contact information you provide to us to contact you about our products and services. You may unsubscribe from these communications at any time. For information on how to unsubscribe, as well as our privacy practices and commitment to protecting your privacy, check out our Privacy Policy

WITec's award-winning TrueSurface microscopy is now available as an integrated option for the alpha300 microscope series. This development enables topographic Raman Imaging on large samples for the full range of WITec instruments.

The new imaging mode is also available as an upgrade for installed alpha300 and alpha500 systems.

Current users will appreciate this considerable expansion of their instrument's capabilities and the varied advantages TrueSurface Microscopy provides in taking their research further in the future.

The functional core of the measurement mode is the sensor for optical profilometry, now fixed in the microscope objective turret. The system measures the surface topography of large samples and correlates it with confocal Raman microscopy.

This allows very rough or heavily inclined samples to be chemically characterized precisely, automatically and easily while also being confocally imaged. The decisive advantage: Extensive, time-consuming sample preparation is rendered obsolete.

“Our customers have with every WITec system the possibility to undertake macroscopic investigations along the surface of a sample on the millimeter-scale, while performing microscopic 3D Raman Imaging measurements on the sub-micron scale" explained Dr. Olaf Hollricher, WITec co-founder and managing director R&D.

"The pioneering integration of an optical profilometer in a Raman microscope opens to scientists new possibilities in surface analysis only offered in the modular WITec systems."

Advertisement