ZEISS Increases the Speed of the World’s Fastest Scanning Electron Microscope
Product News Oct 23, 2015
At the annual Neuroscience meeting in Chicago, October 17- 21, 2015, ZEISS will present a new variant of the world’s fastest scanning electron microscope: ZEISS MultiSEM 506 features 91 beams working in parallel and increases the throughput of the ZEISS MultiSEM 505 by a factor of three.
The unrivaled net acquisition speed of more than 2 Tera pixel per hour enables large-scaled experiments such as imaging of cubic millimeters of brain tissue at nanometer resolution for the analysis of neural circuits. For the research work conducted as part of numerous brain initiatives this will speed up the ability to map whole areas of the brain to understand the neuronal network.
The new product also demonstrates that the ZEISS multi-beam technology is scalable and will satisfy future throughput needs also in other fields, for example in semiconductor applications.
A first prototype of the ZEISS MultiSEM 506 has already been installed at Max Planck Institute of Neurobiology in Munich earlier this year.
The ZEISS MultiSEM 505 and 506 are designed for continual operation and fitted with the intuitive ZEISS ZEN Software which provides new features like automated section detection of serial tissue sections.
On November 12, 2015 ZEISS offers a customer webinar to give deeper insight into ZEISS MultiSEM technology and its applications (Registration on http://bit.ly/MultiSEM-Webinar).