Five Compelling Reasons to Replace Sieve Analysis with Laser Diffraction
White Paper Oct 25, 2016
Sieving remains in use across the manufacturing industry due to its low cost, simplicity, and ability to measure relatively coarse particles up to several centimeters in size. However, the technique has pronounced drawbacks which make it unsuitable for supporting high productivity, modern manufacturing.
These disadvantages can be overcome by a move to laser diffraction technology, which delivers faster, simpler analysis along with a wider measurement range, better resolution and easier maintenance. Here we explain why a switch from sieving to laser diffraction should be a priority for manufacturers looking to optimize analytical productivity and increase efficiency.
Related White Papers
8 Reasons why it’s Time to Upgrade to Automated ImagingWhite Paper
Why automated image analysis is rapidly replacing manual microscopy for characterizing particle shape and how combining it with Raman spectroscopy adds chemical identification.READ MORE
7 Key Factors When Considering a Benchtop X-ray DiffractometerWhite Paper
In this white paper, our marketing director of the America’s Kathy Macchiarola outlines the important decisions factors that are key requirements and help you select a benchtop system ideal for your situation and your needs.READ MORE
The Use of EDXRF for Pharmaceutical Material Elemental AnalysisWhite Paper
The recent changes to the United States Pharmacopeia (USP) regarding requirements for elemental impurity testing has peaked interest into new ways to perform this testing. Combining these new requirements with the introduction of USP chapter <735> X-ray fluorescence spectrometry1 permits a new alternate method for quantifying elemental impurities in pharmaceutical materials.READ MORE