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Asylum Research Introduces the MFP-3D Origin™ AFM
Product News

Asylum Research Introduces the MFP-3D Origin™ AFM

Asylum Research Introduces the MFP-3D Origin™ AFM
Product News

Asylum Research Introduces the MFP-3D Origin™ AFM


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Asylum Research has announced the new MFP-3D Origin Atomic Force Microscope (AFM). The MFP-3D Origin is at the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family.

The MFP-3D Origin features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM.

With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is the best place to start with atomic force microscopy.

“We are very excited that we can now bring the high performance capabilities of the MFP-3D to a larger group of researchers,” commented Ben Ohler, AFM Business Manager.

Ohler continued, “Since not all customers require its most advanced accessories and features, we were able to reduce costs there instead of sacrificing core performance. This is in stark contrast to some competitors who have taken old technology and repackaged it as entry-level AFMs with lower performance. We have heard many times over that ‘if I had the funds, I would buy an Asylum’. The MFP-3D Origin allows limited research budgets to be focused on what’s most important - leading closed-loop resolution and performance, robust reliability, and of course, the unmatched customer support you get when you become an Asylum customer.”

The performance and modern features of the MFP-3D Origin surpass all competitors in its class. It is based on the technology-leading MFP-3D AFM, known for closed-loop precision, high-resolution imaging, and low-noise force measurements.

The MFP-3D Origin offers far more than just the basic scan modes. It includes many advanced modes-nanolithography, Dual AC™ Mode, and piezoresponse force microscopy- at no extra charge.

Additional advanced functionality is easy to add for optional modes such as conductive AFM, AM-FM Viscoelastic Mapping for nanomechanical analysis, scanning tunnelling microscopy (STM), and scanning thermal microscopy (SThM).

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