Bruker Introduces Solution for Organic Photovoltaics Research
Product News Aug 17, 2012
Bruker has announced the release of the Photoconductive Atomic Force Microscopy (pcAFM) module for its industry leading Dimension Icon® platform.
The new accessory enables sample illumination while performing nanoscale electrical characterization.
In conjunction with Bruker’s exclusive PeakForce TUNA™ technology, it uniquely enables highest resolution photoconductivity and correlated nanomechanical mapping for research on fragile organic light emitting diode (OLED) and organic photovoltaic (OPV) device samples.
The pcAFM module is compatible with Bruker’s turnkey 1ppm glove box configuration, addressing the most stringent environmental control needs of organic photoelectric materials.
“Organic photoelectric materials are already finding large markets as OLEDs in mobile device displays. There is also interesting research being conducted on OPV devices,” said Mark R. Munch, Ph.D., President of Bruker Nano Surfaces Division.
Munch continued, “Our new pcAFM accessory transforms the Dimension Icon AFM into a solution for dedicated nanoscale organic photoelectric material research.”
“Nanoscale structure and properties are at the core of key OLED and OPV performance parameters,” added David V. Rossi, Executive Vice President and General Manager of Bruker's AFM Business.
Rossi continued, “Our new pcAFM module builds on our exclusive PeakForce Tapping™ technology to provide the best, highest resolution data advancing organic photoelectric material research.”