FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center
Product News May 12, 2011
FEI Company has announced the installation of three new advanced electron microscope systems from FEI. nanoGUNE now has the world’s most advanced commercially-available microscope, the Titan™ scanning transmission electron microscope (S/TEM); a Quanta™ FEG (field emission gun); and a Helios NanoLab™ DualBeam™ nanofabrication tool in its new facility.
The inauguration of this new laboratory, which will be focused on nanoscience and nanotechnology research, is a key milestone in the development of the research strategy of nanoGUNE and a grand opening event will be held in San Sebastian in June 2011.
“This is very exciting for nanoGUNE, and for the Basque Country, because the installation of the Titan S/TEM will place nanoGUNE at the leading edge of electron microscopy facilities around the world,” said Professor Jose M. Pitarke, Director of nanoGUNE.
Tony Edwards, FEI’s senior vice president, states, “We are pleased to have entered into an agreement that establishes nanoGUNE as an active FEI reference for the installation of new FEI instruments. nanoGUNE will get access to the newest technologies in the fields of electron microscopy and focused ion beam nanofabrication, and we look forward to working with them on the research projects that will be carried out by teams of researchers from both FEI and nanoGUNE.”
The agreement includes the development of several research projects that will be carried out by teams of researchers from both FEI and nanoGUNE. They will join their complementary expertise with the objective of exploring new methods and applications of electron-microscopy and focused-ion-beam techniques.
The Titan aberration-corrected TEM will be used for atomic resolution imaging and analysis of nanostructures and nanodevices. The Quanta FEG offers an ESEM technique that will be used for studying realtime redox chemistry involving nano-objects and imaging fluids under microfluidic conditions.
The Helios NanoLab DualBeam is a focused ion beam/scanning electron microscope (FIB/SEM) that will be used to explore new processes for the fabrication of functional nanostructures and nanodevices.
The contents of the joint projects are in close relation with current research interests of the nanoGUNE research groups, thereby establishing a cooperative framework for the benefit of both parties.