NanoWorld AG Launches High Speed Scanning AFM Website
Product News May 31, 2011
For a long time Fast Scanning in Scanning Probe Microscopy was limited by two factors: no commercial High Speed Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) were available and there were hardly any dedicated High Speed scanning probes available.
On the instrumentation side the first systems have recently been commercialized.
To achieve the best results with these high speed scanning microscopes specially designed high speed scanning probes need to be used that differ from standard AFM probes.
The NanoWorld R&D team is developing AFM probes for fast scanning since many years.
The first commercially available high speed scanning probe, the Arrow UHF, was already introduced in 2004.
Meanwhile a second generation of probes dedicated to High Speed AFM has been developed in collaboration with nanotools GmbH . The prototypes of these developments are currently undergoing an extensive beta testing phase and are expected to be officially introduced soon.
The new website highspeedscanning.com presents information about scanning probe solutions for High Speed Scanning ranging from already commercialized probes such as the Arrow UHF to newly developed Ultra-Short Cantilevers (USC). Visitors to the website will also find an increasing number of High Speed AFM images and videos generously provided by beta-testers and researchers worldwide.