True Surface Microscopy Wins Photonics Prism Award 2011
Product News Feb 03, 2012
WITec has received the prestigious Photonics Prism Award 2011 for the development of TrueSurface™ Microscopy. This internationally respected product innovation award recognizes cutting-edge products that break conventional ideas and improve life through photonics and is presented each year by SPIE and Photonics Media.
In the category of Test, Measurement & Metrology, TrueSurface Microscopy prevailed over strong competition selected by an independent panel of judges.
Winners were announced at an award ceremony on 25. January 2012 during SPIE Photonics West in San Francisco, one of the largest Photonics Exhibitions in the world.
True Surface Microscopy allows confocal Raman imaging guided by surface topography.
The topographic coordinates measured by an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode.
The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined.
TrueSurface Microscopy has already received the PITTCON 2011 Editors Gold Award, the R&D 100 Award 2011 and the Microscopy Today Innovation Award 2011.
“Receiving this award is a perfect start to the new year and a great motivation for us to further establish TrueSurface Microscopy in the photonics community and provide our customers with cutting edge technology” says Dr. Klaus Weishaupt, Managing Director, Marketing & Sales of WITec who accepted the award at the gala event in San Francisco.
Dr. Weishaupt continued, “It is verification that our established market approach of pioneering technology and continuous innovation in advanced imaging solutions will extend our position as a leader in the field of Raman and scanning-probe microscopy.