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Cypher Atomic Force Microscope Wins R&D100 Award for Asylum Research

Cypher Atomic Force Microscope Wins R&D100 Award for Asylum Research

Cypher Atomic Force Microscope Wins R&D100 Award for Asylum Research

Cypher Atomic Force Microscope Wins R&D100 Award for Asylum Research

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Asylum Research and R&D Magazine have announced that Asylum’s Cypher Atomic Force Microscope (AFM) has been awarded the R&D100 Award for 2009. Cypher is said to be the first completely new small sample AFM/SPM in over a decade and is the world’s highest resolution AFM.

The Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy and control of closed loop with atomic resolution for accurate images and measurements possible today.

In addition to its superior capabilities for imaging and measurement, Cypher breaks down ease-of-use barriers with its exclusive point-and-click SpotOn™ automated laser and photodetector alignment.

Additional capabilities include interchangeable light source modules that allow laser spot sizes down to 3um for broad application and scan mode flexibility, and support for high-speed AC imaging (>10x faster) with cantilevers smaller than 10um. The system also includes an integrated enclosure which provides acoustic and vibration isolation, as well as excellent thermal control for image and measurement stability.

The winning of an R&D100 Award provides a mark of excellence known to industry, government, and academia as proof that the product is one of the most innovative of the year. Winners are selected by an independent judging panel of technology experts and the editors of R&D Magazine.

The R&D100 award will be presented to Asylum Research’s development team at an Awards Banquet in Orlando on November 12, 2009. Cypher has also been awarded Laboratory Equipment Magazine’s 2009 Reader’s Choice Award.

“The R&D100 Awards honor the latest technology developments that are designed to meet societal, scientific, or business challenges facing us today - and tomorrow,” said Rita Peters, editorial director of R&D Magazine.