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Aspectrics Showcases EP-NIR Analyzer at PITTCON 2007
Aspectrics, Inc. has announced the launch of its Encoded Photometric Near Infrared (EP-NIR) analyzer.
This Near-Infrared MultiComponent™ 2750 analyzer achieves a spectral range of 1375-2750nm and an ultra fast scan speed of 100scans/second.
Designed to enable users in the process industry to monitor their processes in real time, Aspectrics EP-NIR analyzer will be showcased on booth # 4417 at PITTCON® 2007, McCormick Place, Chicago, Illinois, February 25- March 2, 2007.
Also being displayed on booth #4417 will be Aspectrics’ award-winning EP-IR analyzers.
Recently presented with the R&D Top 100 Award, Aspectrics EP-IR MultiComponent™ Analyzer has been recognized as one of the top 100 most technologically significant products introduced into the marketplace in 2006.
Aspectrics EP-IR analyzers have recently achieved military 202G Method 204D certification for passing the High Frequency resistance Test.
The test was performed to determine the effect of vibration on component parts of the analyzers in frequency ranges of 0.5 to 30 Hz.
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