Bruker AXS Microanalysis Introduces Ultra-fast EBSD System
Product News Aug 11, 2008
At the Microscopy & Microanalysis 2008 Annual Meeting opening, Bruker AXS Microanalysis has introduced several new products and options for Scanning Electron Microscope (SEM) based materials analysis.
The new QUANTAX CrystAlign™ system for SEM-based crystallographic analysis via electron backscatter diffraction (EBSD) consists of an EBSD detector and EBSD analysis software that is integrated with Bruker’s EDS software, ESPRIT™.
The combination of EBSD with Energy Dispersive X-Ray Spectroscopy (EDS) offers more comprehensive materials characterization capabilities in Scanning Electron Microscopes for a broad range of applications on metals, ceramics, and geological samples.
Bruker AXS Microanalysis also presents the XFlash® 5000 series of liquid nitrogen free XFlash® silicon drift detectors (SDD) for use with its QUANTAX microanalysis systems. These new detectors boast improved energy resolutions down to 123 eV at Mn-Ka and 100,000 cps input count rate.
All detectors are equipped with an optimized electron trap, which supports interference-free x-ray detection, even at very low excitation energies. The new XFlash® 5000 family makes QUANTAX the ideal EDS X-ray system for nanoanalysis.
In addition, Bruker’s new ESPRIT Feature software package extends the capabilities of the QUANTAX EDS analysis systems for advanced particle analysis applications.
ESPRIT Feature utilizes the speed of both the QUANTAX image digitizer and the XFlash EDS detector for particle identification and chemical classification. Among its image analysis functions are configurable feature detection, and a review function, as well as chart and report generation.