Malvern Process Specialist Presents On-line Nano-particle Characterization
Product News Jan 07, 2015
Alon Vaisman, Product Development Manager for Process Systems at Malvern Instruments, will speak about two quite different analytical techniques and their applications as part of the ‘Particle Characterization’ session at this year’s IFPAC® (International Forum on Process Analytical Technology and Quality by Design) Annual Meeting (Jan 25 - 28, 2015; Arlington, VA, USA).
In separate presentations he will discuss the ‘Applications of Dynamic Light Scattering as PAT for on-line nano-particle characterization’ and ‘In-situ monitoring of high shear and fluid bed processing using spatial filter velocimetry’. Both address areas of growing emphasis in pharmaceutical production.
The continuing importance of large molecule based therapeutics, and the drive to reduce the particulate size of small molecule APIs, is bringing new challenges for in-process particle characterization.
Automation of Dynamic Light Scattering (DLS) measurements, and the use of this technology as a process analytical tool, is supporting advances in process development and manufacturing control. ‘Applications of Dynamic Light Scattering as PAT for on-line nano-particle characterization’ will include examples of the application of on-line DLS in processes such as nano-milling and emulsification.
Considering the opposite end of the particle size spectrum, ‘In-situ monitoring of high shear and fluid bed processing using spatial filter velocimetry’ reviews the implementation of spatial filter velocimetry-based PAT tools for in-situ particle size analysis within fluidized bed and high shear granulation processes during pharmaceutical production.
Examples of the application of the technique to monitoring coating layer thickness and detecting agglomeration during Wurster coating will also be discussed.