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PerkinElmer Introduces Spectrum™ 400 Infrared Spectrometer for FT-IR and FT-NIR Measurement Capabilities
Product News

PerkinElmer Introduces Spectrum™ 400 Infrared Spectrometer for FT-IR and FT-NIR Measurement Capabilities

PerkinElmer Introduces Spectrum™ 400 Infrared Spectrometer for FT-IR and FT-NIR Measurement Capabilities
Product News

PerkinElmer Introduces Spectrum™ 400 Infrared Spectrometer for FT-IR and FT-NIR Measurement Capabilities


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PerkinElmer, Inc. has debuted at PITTCON® 2007, an advanced spectroscopy tool combining optimized near-infrared (NIR) and optimized mid-infrared (MIR) spectroscopy in a single, research-grade instrument.

The Spectrum™ 400 features the ability to automatically switch between NIR and MIR measurement modes and dual sampling positions, enabling the user to change between applications to drive productivity with automatic, push-button ease. It will aid in research, method development, analysis and trouble-shooting in a broad range of chemical and material, pharmaceutical and academic applications.

“The Spectrum 400 was developed in response to customer demand for more flexible, high-performance NIR and MIR testing to enable thorough product and process research,” said Simon Wells, Ph.D., Molecular Spectroscopy business unit manager, PerkinElmer Life and Analytical Sciences.

“The spectrometer offers a high level of sampling and applications versatility to provide more analytical information.  It incorporates a unique design that is extremely robust, fast and simple to operate,” Wells added.

The Spectrum 400 is offered with an extensive software suite, including PerkinElmer’s AssureIDTM software, which guides and trouble-shoots method development and validation and also provides a simple interface for manufacturing analysis. This results in faster method development, more robust testing procedures.

Available for shipment in May, the Spectrum 400 further supports increased product understanding with the ability to be used in conjunction with the recently introduced PerkinElmer Spotlight™ 400 FT-IR Imaging System, enabling MIR, NIR and attenuated total reflectance (ATR) imaging capabilities.

The Spectrum 400 instrumentation also includes a number of exclusive and patented FT-IR design approaches to increase the quality of data obtained and ensure consistency of measurements over time and between instruments. These features, which include high-quality optical components and a broad range of sampling options, are carried through the Spectrum 100, 100N and 400 range to ensure that methods and spectra can be easily transferred between research and routine-testing laboratories.

“This instrument’s scalability enables smooth analytical roll-out as companies expand globally,” Wells noted.

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