Rigaku Features a Range of XRF and XRD X-ray Analytical Products at PITTCON 2007

Rigaku has announced its attendance at the 58th annual Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (PITTCON) from February 26 through March 2, 2007 at the McCormick Place Convention Center (Booth #4239) in Chicago, Illinois.

At the meeting, Rigaku will introduce an advanced automated X-ray Diffraction (XRD) system designed and equipped for nanomaterials research: the Rigaku SmartLab. NANO Extreme.

Combining a horizontal sample mount with unique patented Cross Beam Optic (CBO) technology, and equipped with proprietary, artificially intelligent Guidance software, the SmartLab NANO-Extreme is designed to offer nanomaterials researchers the full range of X-ray diffraction measurements in one fully automated instrument.

Also making their PITTCON debut are the Rigaku MiniFlex II benchtop X-ray diffraction (XRD) system and the Rigaku NANOHUNTER benchtop Total Reflection X-ray Fluorescence (TXRF) spectrometer.

A variable incident beam slit and diffracted beam monochromator make it suitable for a wide range of applications, including: phase ID, quantitative analysis, crystallinity measurement, and structural characterization.

The NANOHUNTER is the general purpose TXRF instrument to feature fully automatic control of all axes, allowing not only surface analysis but also multiple layer coating and substrate analysis as well.

Complementing the NANOHUNTER and MiniFlex II as part of the MiniLab line of benchtop X-ray instruments, the Rigaku SCXmini provides access for routine small molecule crystallography.

The SCXmini system is designed to allow single crystal X-ray diffraction to become a routine laboratory method and teaching tool in the same way that NMR and FT-IR did a decade ago.

Also shown will be the Rigaku Primini. benchtop Wavelength Dispersive X-ray Fluorescence (WDXRF) spectrometer.