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Rigaku Introduces Cartesian Geometry EDXRF at ACS Fall 2009
Product News

Rigaku Introduces Cartesian Geometry EDXRF at ACS Fall 2009

Rigaku Introduces Cartesian Geometry EDXRF at ACS Fall 2009
Product News

Rigaku Introduces Cartesian Geometry EDXRF at ACS Fall 2009


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Rigaku has introduced a new benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer, the Rigaku NEX CG, at the Fall 2009 American Chemical Society (ACS) national meeting in Washington, D.C.

The NEX CG spectrometer delivers qualitative and quantitative determination of major and minor atomic elements in a variety of sample types with minimal standards.

The new Rigaku NEX CG can analyze elements from 11Na to 92U in solids, liquids, powders and thin films. Employing polarized excitation for lower detection limits and software for reduced standards' requirements, the instrument provides part-per-billion (ppb) level detection limits for aqueous samples when used with the patented UltraCarry® sample holder. A simplified user interface, EZ Analysis, allows for routine operation by non-technical personnel.

Unlike conventional EDXRF analyzers, the Rigaku NEX CG was engineered with a close-coupled Cartesian Geometry (CG) optical kernel that increases signal-to-noise. The resulting reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis.

NEX CG is powered by new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards.
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