Rigaku Introduces the RAPID™ II Curved Detector X-ray Diffraction System

Rigaku Americas Corporation has announced the introduction of a new, compact, fully integrated high-resolution X-ray diffraction system, the Rigaku RAPID II.

According to Rigaku, the latest member of the RAPID family of large area curved imaging plate (IP) detectors, the RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallography.

Typical applications include: high-resolution charge density measurement, micro-diffraction, diffuse scattering, measurement of weakly diffracting disordered materials, small molecule crystallography, wide angle X-ray scattering (WAXS), stress and texture measurements, as well as general purpose powder diffraction.

Central to the performance of the versatile Rigaku RAPID II is the new 2DP software that delivers the extraordinary power of project-based batch processing of two-dimensional (2D) X-ray diffraction data. This capability allows manipulation of multiple images at the same time with various analytical protocols.

In addition to general 2D intensity image processing, the software provides for: display and automatic calculation of stress and texture data, as well as line and azimuthal integration for general purpose powder diffraction.

RAPID II is so versatile that it can replace several instruments without compromising data quality. Its curved large-area detector subtends a 2? range of 204° at a single detector setting for maximum reciprocal space coverage.

Available optics range from a traditional graphite monochromator or high-performance SHINE™ optic to a VariMax™ confocal X-ray optic. Two goniometer configurations are available: a partial-? arrangement for chemical crystallography and a fixed-? system, with manual or automatic XY translation, for applied crystallography.

The RAPID II includes a fully integrated CCD video camera system with zoom capabilities to image sample areas down to 1 micron. Because the Rigaku RAPID II is capable of analyzing samples as small as 10 microns, the system provides non-destructive identification of small particles (and incorporated aggregates) from a wide range of samples. In addition, XY mapping capabilities allow the measurement at precise locations of larger samples.