We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience. You can read our Cookie Policy here.

Advertisement
Thermo Fisher Scientific Introduces Escalab 250Xi Fully Integrated X-ray Photoelectron Spectrometer
Product News

Thermo Fisher Scientific Introduces Escalab 250Xi Fully Integrated X-ray Photoelectron Spectrometer

Thermo Fisher Scientific Introduces Escalab 250Xi Fully Integrated X-ray Photoelectron Spectrometer
Product News

Thermo Fisher Scientific Introduces Escalab 250Xi Fully Integrated X-ray Photoelectron Spectrometer


Want a FREE PDF version of This Product News?

Complete the form below and we will email you a PDF version of "Thermo Fisher Scientific Introduces Escalab 250Xi Fully Integrated X-ray Photoelectron Spectrometer"

First Name*
Last Name*
Email Address*
Country*
Company Type*
Job Function*
Would you like to receive further email communication from Technology Networks?

Technology Networks Ltd. needs the contact information you provide to us to contact you about our products and services. You may unsubscribe from these communications at any time. For information on how to unsubscribe, as well as our privacy practices and commitment to protecting your privacy, check out our Privacy Policy

Thermo Fisher Scientific Inc. has announced the new Thermo Scientific Escalab 250Xi X-ray photoelectron spectrometer (XPS). This fully integrated surface characterization tool is designed to meet the demands of surface engineers whether working in cutting-edge research and development of new surface chemistries or dealing with routine characterization of surfaces, thin films and coatings.

The Escalab 250Xi is the latest development in the world renowned Thermo Scientific Escalab product line. The new instrument integrates premier spectrometer performance with the Thermo Scientific Avantage XPS acquisition and processing user interface. This combination of instrumentation and software combines high sample throughput with analytical performance, essential for tackling the complex materials characterization needs of surface analysis applications.

Additionally, the integration of an advanced parallel image detection system enables quantitative spectroscopic analysis of small features within the image field of view.

The Avantage Data System offers exceptional levels of productivity via an optimized workflow that guides analysts through data acquisition, interpretation, processing and report generation. Avantage offers full digital tool control while providing a comprehensive range of XPS spectrum and image processing routines. Customized laboratory reporting templates allow analysis reports to be easily exported to standard PC applications, such as Microsoft Office, at the click of a mouse.

The Escalab 250Xi platform flexibility enables analysts to configure the system with a range of other surface characterization techniques. Ion scattering spectroscopy (ISS) and reflection electron energy loss spectroscopy (REELS) are provided with the instrument while ultra violet photoelectron spectroscopy (UPS) and Auger electron spectroscopy (AES) are available as options. A sample preparation chamber is provided with the instrument as standard. Where required, the system can be expanded with a selection of sample preparation options and additional experimental chambers.
Advertisement