Veeco Introduces HarmoniX AFM Mode
Product News Jun 05, 2008
Veeco Instruments Inc. has introduced HarmoniX™, a new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis.
Veeco's HarmoniX Nanoscale Material Property Mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps.
The HarmoniX mode is now available on all Veeco scanning probe microscopes that are powered by the new NanoScope® V controller, including the MultiMode® V, Dimension™ V, and BioScope™ II.
David Rossi, Vice President, General Manager of Veeco's Nano-Bio AFM Business, commented, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously impossible.”
Rossi continued, “Our product scientists and engineering team collaborated with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to market. Thousands of publications have referenced Veeco's AFMs, and we believe that HarmoniX, available exclusively from Veeco, represents a major leap forward to enable our customers' further scientific discoveries."