Whitehouse Scientific Sponsors Particulate Systems Analysis Conference 2014
Product News Aug 08, 2014
Whitehouse Scientific is a sponsor for the 2014 ‘Particulate Systems Analysis Conference (PSA)’ organized by the Particle Characterization Interest Group of the RSC. The 12th PSA conference and exhibition takes place from 15 - 17 September 2014 in Manchester UK.
Experts from Whitehouse Scientific will present two papers exploring the use of Image Analysis as an effective solution for the calibration and validation of industrial processes for which particle size and shape are critical parameters.
Dr Graham Rideal, CEO of Whitehouse Scientific, said, “Whitehouse Scientific is pleased to sponsor this year’s Particulate Systems Analysis Conference. Each year PSA provides an excellent platform for those working throughout the scientific industry to freely share knowledge and experience in particle analysis. We’re looking forward to playing a bigger role in this year’s conference and to sharing some of our recent work on developing more effective image analysis solutions for method calibration and validation.”
‘Static Image Analysis - Critical Elements in Calibration and Validation’ will be delivered by Keith Brocklehurst, Senior Scientist at Whitehouse Scientific and Fellow of the Royal Society of Chemistry. The paper investigates the factors that influence and distort particle image analysis, and the calibration and validation techniques available to address these issues.
Graham Rideal will then present ‘The Importance of Particle Shape in Analyzing Aperture Sizes in 3D-Woven Stainless Steel Meshes by Challenge Testing’. The presentation explores how image analysis is the only calibration techniques available to deliver NIST traceable results for complex twilled meshes down to 5 microns.
The Whitehouse Scientific team will be on hand throughout the event to discuss any aspects of particle size and shape characterization and offer expert guidance on the application of calibration standards.
This year’s PSA2014 conference and exhibition will be relevant to a range of scientific, technological and engineering sectors and has a focussed section on the characterization of industrially significant ultra-fine bubbles.