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FEI Launches Research Dualbeam
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FEI Company has released its Helios NanoLab™ DualBeam™ at Microscopy and Microanalysis 2006 in Chicago.
The Helios NanoLab features an ultra-high resolution field emission SEM column combined with FEI’s widely acclaimed Sidewinder™ FIB column and gas chemistries to provide levels of imaging resolution and contrast in a DualBeam system.
It also delivers enhanced stability and optimized operation within a wide range of parameters.
The small DualBeam platform is designed to enable 3D characterization, analysis and image reconstruction applications, nano-prototyping (fabrication and testing) capabilities, and high-quality sample prep abilities for researchers and developers needing to reach deep into the nanoscale.
"The Helios NanoLab was designed to address the demanding requirements of our growing base of DualBeam users in both research and product development environments," said Rob Fastenau, senior vice president of FEI’s NanoResearch and Industry market division.
"FEI continues to lead innovation in combined FIB/SEM solutions. We believe that users of this all-new DualBeam platform will be able to achieve ground-breaking results in multiple applications with accuracy and repeatability."
With its sample preparation capabilities, the Helios NanoLab complements FEI’s Titan S/TEM which continues to receive industry acclaim since its launch at last year’s Microscopy & Microanalysis show.
The Helios system is designed to enable preparation of the thinnest S/TEM samples with little damage to samples.
