Electron Microscopy – Products

Product News
FEI Announces New Titan ETEM G2
Researchers developing energy and environmental products, such as catalysts, fuel cells and nanomaterials, can observe and characterize interactions in operational gas environments.

Product News
FEI Adds Patented UniColore Technology to Versa 3D DualBeam
Versa 3D DualBeam now offers both an analytical mode, with beam currents up to100nA, and an imaging mode, with resolution of 1.4nm at 1kV-all in one instrument.

Product News
FEI Announces New DualBeam Solutions
New accessories enable improved yield of ultrathin sample preparation and enhance flexibility and control of gas-assisted milling and deposition processes.

Product News
Carl Zeiss Introduces ORION NanoFab Downloads and Links
Extending nanofabrication to the sub-10 nanometer scale.

Product News
Agar Scientific Announces New Highly Concentrated Colloidal Gold For Research Applications
New range of gold colloidal nanoparticles from British Biocell International.

Product News
Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Analytica 2012
Designed to deliver confident analyses with increased sensitivity, specificity and productivity.

Product News
FEI Launches New Core-to-Pore Imaging Workflow for Shale Gas Reservoirs
Workflow provides a coherent and correlated view of image data sets over a range of scales, from macro-scale features of the drill core to sub-micron-scale porosity features.

Product News
Innovative Combination of FIB/SEM Technology with Laser Ablation for Fast Sample Preparation
An innovative configuration of the proven AURIGA® CrossBeam (FIB-SEM) workstation combines a pulsed micro-focus laser for fast ablation of material with proven FIB-SEM technology.

Whitepaper
A Review of Imaging Techniques Compatible with Three Dimensional Culture of Cells Grown in Alvetex® Scaffold

Product News
Agar Scientific Announces the Kleindiek Nanotechnik Lift-Out Shuttle
Lift-Out Shuttle for electron microscopists.
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