Electron Microscopy – Products

Helios outperforms competition for failure analysis, 3D nanoscale characterization and prototyping, and other techniques.

The new b-amyloid peptides are labeled with biotin as well as N-terminal biotin labeled b-amyloid peptides with a fluorescein label on the C-terminus.

The Fibermetric system is developed to deliver statistically valid data in minutes to improve fiber and filter material development and manufacturing.

NanoSight adds new super-sensitive system to its range of instruments for imaging and sizing nanoparticles in liquid suspension.

Next-Generation 123 eV resolution XFlash® silicon drift detectors and advanced particle analysis software launched at EMC 2008.

NanoSight Limited announced that the University of Leeds is committed to the use of their Nanoparticle Tracking Analysis system for the study of wear debris generated in orthopaedic implants.

The National Institute of Standards and Technology (NIST) has used the Zetasizer Nano particle characterization system from Malvern Instruments as part of the qualification and assessment process for its new gold nanoparticle reference materials.

The Company has introduced 123 eV resolution XFlash® silicon drift detectors and new particle analysis software.

The new FEI® Connectivity Solutions are designed to reduce a lab’s “wafers-to-atoms” time from days to hours.

According to Company, its Magellan SEM is first to enable rapid 3D surface imaging at sub-nanometer resolution.